Introduction to Electron Microscopy

After participation in this course, a student should be able to understand the theories and mechanics of

electron microscopy, prepare specimens for EM observation, align the column and observe specimens with the EM, and produce high quality EM photomicrographs. The use of the Scanning Electron Microscope (SEM) will be included. The theory and practical aspects of performing compositional analysis and mapping using the energy dispersive and wavelength dispersive x-ray spectrometers will be covered. At completion of the course, the student should be able to use the integrated SEM/EDS/EBSD system to qualitatively determine composition, as well as understand the use of calibration to produce quantitative results. Use of the system for digital image acquisition and elemental mapping will be covered. The student will learn appropriate methods for preparing samples for observation in the SEM, and learn to recognize artifacts of sample preparation. The student will select a project for analysis and prepare a portfolio of photomicrographs and/or analyses demonstrating proficiency with either microscope, and with the integrated analytical equipment, as appropriate to the project

chosen.