Intro to Scanning Electron Microscopy
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Overview
Description
The theory and practical aspects of performing compositional analysis and mapping using the energy dispersive x-ray spectrometer will be covered. At completion of the course, the student should be able to use the integrated SEM/EDS system to qualitatively determine composition as well as understanding the use of calibration to produce quantitative results. Use of the system for digital image acquisition and elemental mapping will be covered.
Career
Graduate
Credits
Value
0
Max
3
Min
3
Number Of Credits
0
Number Of Repeats
0
Repeatable
No
Code
51bbe6179817011d9cadea0694212abf
Instructor Contact Hours
0
Instruction Mode
Lecture
Optional Component
No
Workload Hours
100